Customer Results
What happens when gigafactory teams get the head start.
We don't name customers. Gigafactory operators don't put their formation yield data on vendor websites — and we wouldn't ask them to. What you'll find here are deployment descriptors and result data we've been authorized to share. Numbers are not composites.
Unexplained yield variance on one formation channel cluster causing 8–12 tray scraps per shift. Three months of internal investigation had not identified the root cause.
Root cause identified (fill head alignment) in 6 days. Scrap reduced 74% on affected channels within 30 days of process adjustment.
"We'd spent 3 months chasing that yield dip. Moldpathio found it in the first formation run we monitored."
High internal resistance outliers at EOL test on NMC cells, rate: ~4.2% of cells. Standard SPC had no leading indicator — the issue appeared only at final QC.
Moldpathio correlated outliers to specific formation temperature excursions in step 3. Process adjustment reduced outlier rate from 4.2% to 0.8%.
"The dQ/dV peak analysis flagged something our SPC system had no visibility into. That's the product right there."
Process parameters not yet optimized for North American ambient conditions. High lithium plating risk during ramp, with formation protocol carried over from home factory.
Moldpathio deployed during commissioning. Formation parameter envelope set 35% tighter than factory default. Ramp yield loss reduced by half versus comparable line ramp at home plant.
"Using Moldpathio during ramp meant we learned our process in weeks, not quarters."
Have a formation yield problem you haven't been able to root-cause?
Bring it to a 30-minute call. We will tell you whether Moldpathio's defect taxonomy is likely to find it — before you commit to a pilot. If it's outside our detection scope, we'll say so.
Book a 30-Minute Call